Experimental electron scattering data - View (Graph,Add)

Databases available

Information about the database tables

• Measured electron signals
  Consist of the name of the actual measured parameter, e.g., backscattered electron data, secondary electron data, etc
• Reference sources
  Consists of the article, book, or conference proceedings paper in which the results to be entered appear
• Basic material
  This is the basic name for the material. For example, Sillicon is a basic material. For each basic material there are 1 or more specific material types (see next entry for examples).
• Specific material
  This entry describes the characteristic of the basic material. In the example above, if Silicon is the basic type, possible options for the specific material could be:
  • single-crystal
  • amorphous
  • large crystalline grains

Viewing data in table: sigs